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초음파 검사기

WL500K

​▪​ Full Auto SAT

▪​ Transducer Frequency : 75~250Mhz

▪​ Scan Speed  : Max 1m/s​

▪​ Scan Area (X x Y) : 350x350mm

▪​ System Dimension : 1650x2250x2000mm

▪​ 적용 Application : Wafer 등

MUS-100

▪​ Manual SAT

▪​ Transducer Frequency : 25~75Mhz

▪​ Scan Speed  : Max 1.2m/s​

▪​ Scan Area (X x Y) : 300x400mm (Single Probe)

                                  300x200mm (Dual Probe)

▪​ System Dimension : 840x1150x1670mm

▪​ 적용 Application : DBC, Power Module 등

MIT-U100

▪​ Full Auto SAT

▪​ Transducer Frequency : 75Mhz (Array Probe)

▪​ Scan Speed  : Max 0.5m/s​

▪​ Scan Area (X x Y) : 200x165mm (Dual Array Probe)

                                  200x165mm (Quad Array Probe)

▪​ System Dimension : 4300x1590x1870mm (Dual Array Probe)

                                    5500x2080x2460mm​ (Quad Array Probe)​

▪​ 적용 Application : DBC, Power Module 등